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All layer thickness measurement
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All layer thickness measurement

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All layer thickness measurement
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FR-Mic
FR-Mic
Single Point Measurement
POLOS
FR-Mic Webshop » Layer Thickness Measurement » Single Point Measurement
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8 Versions:
FR-Mic 200 nm - 1020 nm spectral range Webshop » Layer Thickness Measurement » Single Point MeasurementFR-Mic 200 nm - 1100 nm spectral range Webshop » Layer Thickness Measurement » Single Point MeasurementFR-Mic 200 nm - 1700 nm spectral range Webshop » Layer Thickness Measurement » Single Point Measurement
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FR-pOrtable
FR-pOrtable
Single Point Measurement
POLOS
FR-pOrtable 12777.6 Webshop » Layer Thickness Measurement » Single Point Measurement
FR-pOrtable is a unique, miniaturized, turn-key solution for accurate & precise non-destructive optical characterization of transparent and semi-transparent
12 nm to 90 μm
380 nm - 1020 nm
20,000 h
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FR-pRo
FR-pRo
Single Point Measurement
POLOS
FR-pRo 13915 Webshop » Layer Thickness Measurement » Single Point Measurement
FR-pRo is a modular and expandable platform for the characterization of coatings in the 1 nm - 1 mm thickness range. It is used in a wide range of applications
1 nm to 120 μm
190 nm - 1100 nm
Tabletop System
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6 Versions:
FR-pRo 380 nm - 1000 nm spectral range 13915 Webshop » Layer Thickness Measurement » Single Point MeasurementFR-pRo 190 nm - 1700 nm spectral range 32282.8 Webshop » Layer Thickness Measurement » Single Point MeasurementFR-pRo 190 nm - 1000 nm spectral range 33554.8125 Webshop » Layer Thickness Measurement » Single Point Measurement
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FR-Scanner
FR-Scanner
Wafer Mapping
POLOS
FR-Scanner 35235.2 Webshop » Layer Thickness Measurement » Wafer Mapping
FR-Scanner is a compact bench-top tool for the automatic characterization of films and coatings on wafers, masks or other substrates. It is ideal for the fast a
3 nm to 100 um
200 nm - 1020 nm
Tabletop System
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2 Versions:
FR-Scanner UV/VIS spectral range 35235.2 Webshop » Layer Thickness Measurement » Wafer MappingFR-Scanner VIS/NIR spectral range 37752 Webshop » Layer Thickness Measurement » Wafer Mapping