Categories

6-layer-thickness-measurement
All products
13-single-point-measurement
Single Point Measurement
14-wafer-mapping
Wafer Mapping

USB-powered layer thickness measurement tools at the Point-of-Need, modular and expandable for ultra-fast and accurate wafer mapping. These tools are tailored to the customer needs and are used in a wide range of diverse applications such as: Absorbance / Transmittance / Reflectance measurements, layer thickness measurement under temperature and ambient controlled environment or even in liquid environment and many more.