The POLOS® FR-ES is a lightweight, compact instrument designed for accurate characterization of thin films and coatings. Capable of performing reflectance and transmittance measurements across a wide spectral range (370–1700 nm), FR-ES provides reliable, high-performance results for a variety of coating analysis applications.
Versatile applications
FR-ES can be used to measure:
- Film thickness
- Refractive index (n & k)
- Optical color
- Transmittance and reflectance
- And more
Three spectral configurations are available to suit specific measurement needs:
- VIS/NIR (370–1020 nm)
- NIR-N1 (850–1050 nm)
- NIR (900–1700 nm)
Expandable and modular
FR-ES can be customized with a range of accessories for specialized measurements:
- Optical filters to block selected wavelength regions
- FR-Mic for high-resolution spot measurements on small areas
- Manual XY stages (25 × 25 mm, 100 × 100 mm, or 200 × 200 mm)
- Film/Cuvette holders for absorbance, transmittance, and chemical concentration tests
- Integration spheres for diffuse and total reflectance measurements
By combining modules, users can create a tailored system to meet any research or industrial requirement.
Key features
- One-click analysis with no initial guess required
- Dynamic measurements with real-time feedback
- Measurement of optical constants (n & k) and color
- Save images and video for documentation and presentations
- Flexible installation options for offline or auxiliary measurements
- Free software updates
Applications across industries
- Academic and research laboratories
- Semiconductors and microelectronics
- Life sciences and biomedical research
- Polymer and photoresist characterization
- Dielectric and chemical measurements
- Hardcoating, anodization, and metal processing
- Optical coatings and non-metal films
- And many more custom applications
How it works
FR-ES employs White Light Reflectance Spectroscopy (WLRS), measuring the intensity of light reflected from a thin film or multilayer stack over a chosen spectral range. The interference patterns from individual interfaces allow precise determination of film thickness, refractive index (n & k), and other optical parameters. The system is compatible with both free-standing films and supported films on transparent or reflective substrates.
