FR-pRo is a fully modular and expandable platform designed for precise characterization of thin and thick coatings ranging from 1 nm up to 1 mm. Engineered to adapt to your specific research or production needs, FR-pRo is widely applied in diverse areas, including absorbance, transmittance, reflectance measurements, film characterization under controlled temperature and ambient conditions, and even studies in liquid environments.
Customizable, Modular Design
The FR-pRo system is built from user-selected modules to create a tailored setup. The Core Unit houses the light source, spectrometer (covering 200–2500 nm across UV, visible, and near-IR ranges), and control electronics. Optional modules and accessories expand capabilities, including:
- Film/Cuvette Holders for absorbance, transmittance, and chemical concentration measurements
- Film Thickness Kits for accurate coating characterization
- Thermal or Liquid Modules for measurements under controlled temperature or in liquids
- Integrating Spheres for total and diffuse reflectance measurements
By combining these modules, FR-pRo can be configured to meet virtually any application requirement.
Key Features
- One-click analysis with no need for initial parameter guesses
- Dynamic measurement of reflectance, transmittance, absorption, and color metrics
- Video capture for demonstration or presentation purposes
- Preloaded database of 350+ distinct materials
- Free software updates for 3 years
- Windows 7/8/10 compatible
- Thickness range: 12 nm – 90 µm
- Refractive index (n & k) determination
- Broad spectral coverage: 380–1020 nm
- USB-powered and portable
Applications
- Academic and research laboratories
- Life sciences and biomedical research
- Semiconductor and electronics industry
- Polymer and resist characterization
- Dielectric and optical coating evaluation
- Hardcoat, anodization, and metal process monitoring
- Non-metallic film analysis and more
Principle of Operation
FR-pRo uses White Light Reflectance Spectroscopy (WLRS), where light is incident perpendicularly on the sample. The reflected spectrum, generated by interference between film interfaces, allows accurate determination of film thickness, optical constants (n & k), and other material properties. This method works for free-standing films as well as films supported on transparent, partially reflective, or fully reflective substrates.
