Layer Thickness Measurement

Categories

Single Point Measurement

Wafer Mapping
USB-powered layer thickness measurement tools at the Point-of-Need, modular and expandable for ultra-fast and accurate wafer mapping. These tools are tailored to the customer needs and are used in a wide range of diverse applications such as: Absorbance / Transmittance / Reflectance measurements, layer thickness measurement under temperature and ambient controlled environment or even in liquid environment and many more.