FR-pRo is a modular and expandable platform for the characterization of coatings in the 1 nm - 1 mm thickness range. FR-pRo tools are tailored to the customer needs and are used in a wide range of diverse applications such as: Absorbance / Transmittance / Reflectance measurements, layer thickness measurements under temperature and ambient controlled environment or even in liquid environment and many more.
FR-pRo is assembled by user selected modules. The Core Unit accommodate the light source, the spectrometer (for any spectral regime in the 200 nm - 2500 nm range) and the control & communication electronics. Then, there is a wide range of accessories, such as:
- Film/Cuvette Holder for Absorbance/Transmittance and chemical concentration measurements
- Film Thickness kit for characterization of coatings
- Thermal or Liquid kits for measurements under controlled Temperature or in Liquid environment,
- Integration Spheres for diffuse & total reflectance
By the combination of different modules, the final set-up meets any end-user needs.
Features
- Single-click analysis (no need for initial guess)
- Dynamic measurements Reflectance,
- Transmittance, Absorption and Color parameters
- Save videos for presentations
- 350+ non-identical materials
- 3-years free of-charge Software update
- Running on Windows 7/8/10
- Refractive Index (n & k) calculation
- USB powered
- Portable
Applications
- Universities & Research labs
- Life Sciences
- Semiconductors
- Polymer & Resist characterization
- Chemical measurements
- Dielectric characterizations
- Biomedical Hardcoat, Anodization, Metal parts process
- Optical Coating
- Non-metal Films
- And more…
Principle of Operation
White Light Reflectance Spectroscopy (WLRS) measures the amount of light reflected from a film or a multilayer stack over a range of wavelengths, with the incident light normal (perpendicular) to the sample surface.
The measured reflectance spectrum, produced by interference from the interfaces is being used to determine the thickness, optical constants (n & k), etc. of free-standing and supported (on transparent or partially/fully reflective substrates) stack of films.
